VTS 2013 - Call for Participation

CALL FOR PARTICIPATION

Scope -- Key Dates -- Workshop Registration -- Advance Program -- More Information -- Committees

Scope

The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems through an exciting program that includes Keynote, Technical Paper Sessions, Panel, New Topic Sessions, Full-day and embedded Tutorials, Innovative Practices Tracks, PhD Student Contest.

In 2013 VTS will take place in Berkeley, California (USA) and will be sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

The technical program will include:

TECHNICAL PAPER SESSIONS that will present the latest research results in test, including:

- Analog, Mixed-Signal & RF Test
- ATPG & Compression
- ATE Architecture & Software
- Built-In Self-Test (BIST)
- Defect & Current Based Test
- Defect/Fault Tolerance
- Delay & Performance Test
- Design for Testability (DFT)
- Design Verification/Validation
- Diagnosis & Debug
- Embedded System & Board Test
- Embedded Test Methods
- Emerging Technologies Test
- FPGA Test
- Fault Modeling & Simulation
- Hardware Security
- Low-Power IC Test
- Microsystems, MEMS & Sensor Test
- Memory Test & Repair
- On-Line Test & Error Correction
- Power & Thermal Issues in Test
- System-on-Chip (SOC) Test
- Test Standards
- Test Economics
- Test of Biomedical Devices
- Test of High-Speed I/O
- Test Quality & Reliability
- Test Resource Partitioning
- Transients & Soft Errors
- 2.5D, 3D and SiP Test

INNOVATIVE PRACTICE SESSIONS

SPECIAL SESSIONS

DOCTORAL STUDENT CONTEST

EMBEDDED TUTORIALS
- Challenges in SSD
- Embedded DfT Instrumentation - Design, Access, Retargeting and Case Studies

FEATURED PANELS
- Post-Silicon Validation and Test in Huge Variance Era

TTEP TUTORIALS
- Using IEEE P1687 - Erik LARSSON (Lund University, Sweden) and Martin KEIM (Mentor Graphics, USA)
- Statistical and Adaptive Testing - Adit SINGH (Auburn University, USA)

Key Dates

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Avail Early Reg. rates before April 12, 2013!

Workshop Registration

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Registration is available at: http://www.tttc-vts.org/public_html/new/2013/practical.php.

Advance Program

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For draft of program click http://www.tttc-vts.org/public_html/new/2013/program.php.

More Information

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General Information:
GENERAL CHAIR
Michel Renovell
LIRMM - University of Montpellier
renovell@lirmm.fr

Submission related information:
PROGRAM CHAIR
Yiorgos Makris
The University of Texas at Dallas
yiorgos.makris@utdallas.edu

Committees

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General Chair
M. Renovell – LIRMM

Program Chair
Y. Makris – Univ. of Texas at Dallas

Past Chair
C. Metra – Univ. of Bologna

Vice-General Chairs
P. Maxwell – Micron
C. Thibeault – E. Tech. Sup. Montreal

Vice-Program Co-Chairs
L. Anghel – TIMA
R. Galivanche – Intel

New Topics
B. Courtois – CMP
B. Kaminska – Simon Fraser Univ.

Special Sessions
K. Hatayama – NAIST
R. Kapur – Synopsys

Innovative Practices Track
B. Cory – Synopsys
S. Mitra – Stanford Univ.

Registration
S. Ozev – Arizona State Univ.

Publications
G. Di Natale – LIRMM

Publicity & Web
Member: S. Di Carlo – Polit. di Torino

Finance
C.H. Chiang – Alcatel-Lucent

Audio/Visual
J. Dworak – SMU

International Liaisons
V. Champac – INAOE Mexico
V. Hahanov – KHNURE Ukraine
R. Makki – UAE Univ.
M. Sonza Reorda – Polit. di Torino
Y. Sato – Kyushu Inst. of Tech.
C-W. Wu – NTHU

Ex-Officio
Y. Zorian – Synopsys

Program Committee
J. Abraham – Univ. Texas at Austin
V. Agrawal – Auburn Univ.
D. Appello – ST Microelectronics
R. Blanton – CMU
B. Becker – Univ. of Freiburg
S. Bernard – LIRMM
A. Chatterjee – Georgia Tech
C.J. Clark – Intellitech
C. Dixit – LSI
P. Girard – LIRMM
D. Gizopoulos – Univ. of Athens
X. Gu – Huawei
S. Gupta – Univ. of Southern Californ.
I. Hartanto – Xilinx
S. Hellebrand – Univ. of Paderborn
C.-T. Huang – NTHU
H. Konuk – Broadcom
X. Li – Chinese Academy of Science
A. Majumdar – AMD
E.J. Marinissen – IMEC
Z. Navabi – Worcester Polytechnic
A. Orailoglu – UC San Diego
J. Rajski – Mentor Graphics
S. Reddy – Univ. of Iowa
S. Shoukourian – Synopsys
O. Sinanoglu – NYU Abu Dhabi
P. Song – IBM
H. Stratigopoulos – TIMA
S. Sunter – Mentor Graphics
M. Tehranipoor – Univ. of Connectic.
J. Tyszer – Poznan Univ.
F. Vargas – PUCRS
L. Wang – UC Santa Barbara
H.-J Wunderlich – Univ. of Stuttgart

Steering Committee
J. Figueras – U of Pol Catalunya
A. Ivanov – U of British Columbia
M. Nicolaidis – TIMA
P. Prinetto – Polit. di Torino
A. Singh – Auburn U
P. Varma – Ansys
Y. Zorian – Synopsys

For more information, visit us on the web at: http://www.tttc-vts.org

The 31st IEEE VLSI TEST SYMPOSIUM (VTS 2013) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).